Determination of electric properties of heterogeneous systems using the contact and noncontact scanning force microscopy (SFM)

Author

Schulz, E. ; Sturm, H. ; Stark, W. ; Bovtoun, V.

Author_Institution

Fed. Inst. for Mater. Res. & Testing, Berlin, Germany

fYear

1996

fDate

25-30 Sep 1996

Firstpage

334

Lastpage

339

Abstract

With an extended contact and non-contact mode scanning force microscope samples with different heterogeneous electrical properties can be characterized. The contact mode method allows the determination of local electric conductivities of heterogeneous systems at the sample surfaces. An interpretation of this behaviour can be obtained in combination with other SFM modes such as topography, friction and compliance used simultaneously. The non-contact mode SFM allows to get more information about the local surface charge of heterogeneous samples. In this paper two new SFM approaches will be discussed on examples of carbon-fibre reinforced, organic and ceramic materials

Keywords

atomic force microscopy; charge measurement; electrical conductivity measurement; carbon-fibre reinforced material; ceramic material; contact mode SFM; electric conductivity; heterogeneous system; local electric properties; noncontact mode SFM; organic material; scanning force microscopy; surface charge; Additives; Ceramics; Circuits; Contacts; Current measurement; Microscopy; Polymers; Surface contamination; Surface topography; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 1996. (ISE 9), 9th International Symposium on

Conference_Location

Shanghai

Print_ISBN

0-7803-2695-4

Type

conf

DOI

10.1109/ISE.1996.578094

Filename

578094