DocumentCode :
3335052
Title :
Effect of crystal length on CdZnTe frisch collar device performance
Author :
Kargar, A. ; Brooks, A.C. ; Harrison, M.J. ; Chen, H. ; Awadalla, S. ; Bindley, G. ; McGregor, D.S.
Author_Institution :
Mech. & Nucl. Eng. Dept., Kansas State Univ., Manhattan, KS, USA
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
2017
Lastpage :
2022
Abstract :
In this study, the impact of crystal length on CdZnTe Frisch collar detector spectroscopic performance is investigated. Four different Frisch collar devices were designed to have identical aspect ratios of 2.0 for simulation purposes, and all four devices were later fabricated and tested. Pulse height spectra were acquired from all Frisch collar devices with a 137Cs gamma-ray check source and the results are presented. The Frisch collar alters the weighting potential within a planar device and improves the charge collection efficiency (CCE) distribution. Thus, the parameters affecting these distributions have a great impact on the pulse height spectrum, and among those is aspect ratio (AR). All four tested devices have similar aspect ratios, and therefore also have similar weighting potential distributions. However, due to trapping effects, the CCE profiles are not the same, and shorter devices show more uniform responses to gamma rays. CCE simulations confirm that the Frisch collar device with the longest drift length has the lowest performance.
Keywords :
nuclear electronics; semiconductor counters; 137Cs gamma-ray check source; CdZnTe Frisch collar detector spectroscopic performance; aspect ratios; charge collection efficiency distribution; crystal length; drift length; planar device; pulse height spectra; trapping effects; weighting potential distributions; Charge carriers; Detectors; Electrons; Energy resolution; Gamma ray effects; Helium; Nuclear and plasma sciences; Space charge; Spectroscopy; Testing; Aspect ratio; CdZnTe; Frisch collar detector;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402138
Filename :
5402138
Link To Document :
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