DocumentCode :
3335317
Title :
Conference overview
Author :
Townsend, David
fYear :
2011
fDate :
23-29 Oct. 2011
Firstpage :
1
Lastpage :
2
Abstract :
The 2011 IEEE Nuclear Science Symposium, Medical Imaging Conference, and 18th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors was held at the Conference Center, Sorolla and Meliá hotels in Valencia, Spain, from October 23 to October 29, 2011. There were 2260 registered attendees and 1692 presentations. These numbers confirm the trend of achieving higher attendance for events held in Europe, ever since the first meeting in Lyon, France to celebrate the millennium in 2000. At this latest European meeting, the first to be held in Spain, there were two workshops held immediately before the conference and one held on the Sunday afterwards. Six short courses were offered resulting in a record attendance of over 370 students. The continuous training program was further complemented by scheduling seven refresher courses and, even with an early 7:30 am start, many courses experienced an attendance similar to that of the main scientific sessions.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia, Spain
ISSN :
1082-3654
Print_ISBN :
978-1-4673-0118-3
Type :
conf
DOI :
10.1109/NSSMIC.2011.6152976
Filename :
6152976
Link To Document :
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