Title : 
Deposition of oriented polymer films for liquid crystal alignment by pulsed laser ablation
         
        
            Author : 
Luo, Qi ; Chen, Xiaoyuan ; Liu, Zhiguo ; Sun, Zhengming ; Ming, Naiben
         
        
            Author_Institution : 
Lab. of Solid State Microstructures, Nanjing Univ., China
         
        
        
        
        
        
            Abstract : 
Well oriented polyethylene (PE) films were prepared on glasses coated with Indium Tin oxide (ITO) and on Si(100) substrates by pulsed laser ablation. The films were characterized by X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy and atomic force microscopy (AFM). Nematic liquid crystal 4´-n-pentyl-4-cyanobiphenyl (5CB) is used to display the orientation features of the films. Based on the experiments, a picture is presented about the formation of the polymer films. It is expected that the as-deposited highly oriented polymer films will find various applications in integrated optics and liquid crystal displays
         
        
            Keywords : 
Fourier transform spectra; X-ray diffraction; atomic force microscopy; infrared spectra; molecular orientation; nematic liquid crystals; optical polymers; polymer films; polymer structure; pulsed laser deposition; 4´-n-pentyl-4-cyanobiphenyl; 5CB; Fourier transform infrared spectroscopy; ITO; ITO coated glass substrates; InSnO; Si; Si(100) substrates; X-ray diffraction; atomic force microscopy; integrated optics; liquid crystal alignment; liquid crystal displays; nematic liquid crystal; orientation features; polymer film formation; pulsed laser ablation; well oriented polyethylene films; Atomic force microscopy; Glass; Indium tin oxide; Infrared spectra; Liquid crystal displays; Liquid crystal polymers; Optical pulses; Plastic films; Polyethylene; Polymer films;
         
        
        
        
            Conference_Titel : 
Electrets, 1996. (ISE 9), 9th International Symposium on
         
        
            Conference_Location : 
Shanghai
         
        
            Print_ISBN : 
0-7803-2695-4
         
        
        
            DOI : 
10.1109/ISE.1996.578096