• DocumentCode
    3335433
  • Title

    Photoluminescence characterization of scintillators for phoswich detectors

  • Author

    Zhuravleva, Mariya ; Melcher, Charles L. ; Eriksson, Lars

  • Author_Institution
    Scintillation Mater. Res. Center, Univ. of Tennessee, Knoxville, TN, USA
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    2407
  • Lastpage
    2410
  • Abstract
    The challenge for advanced PET instrumentation is performance optimization in terms of spatial resolution and sensitivity. The phoswich approach, which leads to a better approximation of the interaction point, provides Depth-Of-Interaction information that can significantly reduce parallax error and improve image resolution. In some cases, the scintillator phoswich layers can have not only different decay times but also different characteristics such as light yields, emission spectra, densities, effective atomic numbers, and indices of refraction. Depending on these properties, light interactions between crystals are possible, which may either limit or enhance phoswich functionality. In this paper, we report experiments on the luminescence characteristics of some promising scintillator materials for PET which could be used in a phoswich detector, such as LaBr3:Ce, LaCl3:Ce, LSO:Ce, GSO:Ce, LPS:Ce, LuYAP:Ce, with an emphasis on investigating excitation/emission spectra, rise times and decay times. For each combination of front and back layer crystals, radioluminescence and photoluminescence spectra were obtained. A Bollinger-Thomas set-up was used to measure luminescence rise and luminescence decay characteristics. Light interactions between scintillator crystals in phoswich detectors were studied and the possibility of measuring convolved light as a result of absorption and re-emission by another crystal layer was experimentally evaluated.
  • Keywords
    positron emission tomography; solid scintillation detectors; Bollinger-Thomas set-up; PET instrumentation; decay times; image resolution; parallax error; phoswich detectors; photoluminescence spectra; positron emission tomography; radioluminescence spectra; scintillator crystals; scintillator phoswich layers; scintillator photoluminescence characterization; spatial resolution; Atomic layer deposition; Crystals; Detectors; Image resolution; Instruments; Luminescence; Optimization; Photoluminescence; Positron emission tomography; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402159
  • Filename
    5402159