DocumentCode :
3335433
Title :
Photoluminescence characterization of scintillators for phoswich detectors
Author :
Zhuravleva, Mariya ; Melcher, Charles L. ; Eriksson, Lars
Author_Institution :
Scintillation Mater. Res. Center, Univ. of Tennessee, Knoxville, TN, USA
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
2407
Lastpage :
2410
Abstract :
The challenge for advanced PET instrumentation is performance optimization in terms of spatial resolution and sensitivity. The phoswich approach, which leads to a better approximation of the interaction point, provides Depth-Of-Interaction information that can significantly reduce parallax error and improve image resolution. In some cases, the scintillator phoswich layers can have not only different decay times but also different characteristics such as light yields, emission spectra, densities, effective atomic numbers, and indices of refraction. Depending on these properties, light interactions between crystals are possible, which may either limit or enhance phoswich functionality. In this paper, we report experiments on the luminescence characteristics of some promising scintillator materials for PET which could be used in a phoswich detector, such as LaBr3:Ce, LaCl3:Ce, LSO:Ce, GSO:Ce, LPS:Ce, LuYAP:Ce, with an emphasis on investigating excitation/emission spectra, rise times and decay times. For each combination of front and back layer crystals, radioluminescence and photoluminescence spectra were obtained. A Bollinger-Thomas set-up was used to measure luminescence rise and luminescence decay characteristics. Light interactions between scintillator crystals in phoswich detectors were studied and the possibility of measuring convolved light as a result of absorption and re-emission by another crystal layer was experimentally evaluated.
Keywords :
positron emission tomography; solid scintillation detectors; Bollinger-Thomas set-up; PET instrumentation; decay times; image resolution; parallax error; phoswich detectors; photoluminescence spectra; positron emission tomography; radioluminescence spectra; scintillator crystals; scintillator phoswich layers; scintillator photoluminescence characterization; spatial resolution; Atomic layer deposition; Crystals; Detectors; Image resolution; Instruments; Luminescence; Optimization; Photoluminescence; Positron emission tomography; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402159
Filename :
5402159
Link To Document :
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