Title :
Characterization of highly pixelated CZT detectors for sub-millimeter PET imaging
Author :
Yin, Yongzhi ; Komarov, Sergey ; Wu, Heyu ; Song, Tae Yong ; Li, Qiang ; Garson, Alfred, III ; Lee, Kuen ; Simburger, Garry ; Dowkontt, P. ; Krawczynski, Henric ; Tai, Yuan-Chuan
Author_Institution :
Deparment of Radiol., Washington Univ., St. Louis, MO, USA
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
Cadmium Zinc Telluride (CZT) detectors with 600¿m pitches and 350¿m pitches in 5mm thickness were developed and tested for investigation pixilated CZT detector applications in Positron Emission Tomography. In addition to flood ¿-ray source measurements (662keV, 122keV and 59.5keV), we scan across pixels with a collimated Co-57 source (collimated beam size < pixel size) with a step size 50¿m. We sorted events based on the number of pixels that detect a charge signal (single, double, triple) and analyzed the charge sharing at different energies for detectors of different pitches. Results show the number of charge sharing events increases when ¿-ray energy increases or when pixel size decreases. Based on the collimated beam measurements of energy at 122keV, the charge sharing range in a 5mm thick CZT detector biased at -1000V was estimated to be around 125¿m FWHM for both 600¿m and 350¿m pitched anodes, while the charge loss is more severe in 350¿m pitched detectors than in 600¿m pitched detectors.
Keywords :
cadmium compounds; collimators; data acquisition; positron emission tomography; semiconductor counters; zinc compounds; CdZnTe; cadmium zinc telluride detectors; charge loss; charge sharing events; collimated Co-57 source; electron volt energy 122 keV; electron volt energy 59.5 keV; electron volt energy 662 keV; flood gamma-ray source measurement; highly pixelated CZT detectors; positron emission tomography; submillimeter PET imaging; Cadmium compounds; Collimators; Detectors; Event detection; Floods; Pixel; Positron emission tomography; Size measurement; Testing; Zinc compounds;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402160