Title :
Quench protection system for the KSTAR superconducting toroidal field coil
Author :
Lee, D.K. ; Choi, J.H. ; Jin, J.K. ; Han, S.H. ; Kong, J.D. ; Kim, C.H. ; Hong, S.L. ; Kim, Y.S. ; Kwon, M. ; Ahn, H.S. ; Jang, G.Y. ; Yun, M.S. ; Seong, D.K. ; Kim, Y.H. ; Lee, Y.W. ; Shin, H.S.
Author_Institution :
Nat. Fusion Res. Inst. (NFRI), Daejeon, South Korea
Abstract :
A compact and unique design of the integrated quench protection (QP) system for the high-current superconducting magnet coils has been fabricated and tested for the toroidal field (TF) coil system of the Korea Superconducting Tokamak Advanced Research (KSTAR) device. The QP system is capable of protecting the TF superconducting magnet coils, which consist of 16 identical coils serially connected with a stored energy of 495 MJ at the design operation level, 35.2 kA per turn. Since the power supply for the TF coils can only ramp up or maintain the coil current, the design of the QP system included two features. The first is a basic fast discharge function to protect the TF magnets by a dump resistor circuit with a 7 sec time constant in case of coil quench events. The second is a slow discharge function with a time constant -360 seconds for a daily TF discharge or for a stop demand from the tokamak control system. The QP system has been tested up to 40 kA with a short circuit and up to 32 kA with superconducting TF coils successfully in the second campaign of KSTAR. This paper will describe characteristics of the TF and the QP systems and test results of the second plasma experiment of KSTAR in 2009.
Keywords :
Tokamak devices; plasma toroidal confinement; superconducting coils; KSTAR superconducting toroidal field coil; Korea Superconducting Tokamak Advanced Research device; current 35.2 kA; design operation level; energy 495 MJ; high-current superconducting magnet coils; quench protection system; Circuit testing; Magnetic circuits; Power supplies; Power system protection; Quadratic programming; Resistors; Superconducting coils; Superconducting magnets; System testing; Tokamaks;
Conference_Titel :
Plasma Science, 2010 Abstracts IEEE International Conference on
Conference_Location :
Norfolk, VA
Print_ISBN :
978-1-4244-5474-7
Electronic_ISBN :
0730-9244
DOI :
10.1109/PLASMA.2010.5534381