Title :
A New Approach for the Diagnosis of Strategic Problems in Technology Management
Author :
Livvarcin, Omer ; Soyak, Baybars
Author_Institution :
Dept. of Bus. Adm., Yeditepe Univ., Istanbul
Abstract :
Technology Strategy Vectorial Model (TSVM) - as named by authors ntroduces a new approach for strategic management of technology. TSVM interprets organizational technology strategy as a vector in a 2D circular coordinate system where azimuth refers to strategic direction and radius to strategic magnitude. Researchers propose TSVM as a tool for the measurement of actual organizational technology strategy and evaluation of strategic performance. Four cardinal strategic directions (innovative, conservative, adaptive, and erratic) and five levels of strategic magnitude - where 5 is the strongest and 1 is the weakest - are employed in the model for expressing the strategic vectors. The strategic vectors of individuals would be measured by a carefully-designed questionnaire. Measured individual vectors are summed with a specifically designed software program and thereby the resultant organizational vector is calculated. Besides determining exact organizational technology management status in terms of strategic direction and magnitude, the model is also expected to be useful for the diagnosis of strategic problems such as strategic deviation and deficiency. Strategic deviation refers to the directional deviation from the intended direction and strategic deficiency refers to the difference between the intended and measured strategic magnitudes. TSVM is proposed as a new tool to help decision makers to see the gap between where they are and where they want to be and apply the appropriate correction
Keywords :
decision making; strategic planning; technology management; vectors; 2D circular coordinate system; Technology Strategy Vectorial Model; organizational technology management; organizational vector; software program; strategic performance evaluation; strategic problems; Azimuth; Business; Engineering management; Production; Research and development; Shape; Software design; Software measurement; Technology management;
Conference_Titel :
Technology Management for the Global Future, 2006. PICMET 2006
Conference_Location :
Istanbul
Print_ISBN :
1-890843-14-8
DOI :
10.1109/PICMET.2006.296552