• DocumentCode
    3335626
  • Title

    AlGaN/GaN microwave power HEMTs

  • Author

    Eastman, L.F.

  • Author_Institution
    Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
  • fYear
    1999
  • fDate
    23-23 June 1999
  • Firstpage
    10
  • Lastpage
    13
  • Abstract
    AlGaN/GaN HEMTs on sapphire and SiC substrates have strong advantages over other microwave power transistors. High breakdown voltage, high average power, and high efficiency have been obtained.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; microwave field effect transistors; microwave power transistors; power HEMT; wide band gap semiconductors; AlGaN-GaN; AlGaN/GaN microwave power HEMT; SiC substrate; average power; breakdown voltage; efficiency; sapphire substrate; Aluminum gallium nitride; Buffer layers; Electron mobility; Gallium nitride; Gold; HEMTs; Nickel; Piezoelectric polarization; Silicon carbide; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 1999 57th Annual
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-5170-3
  • Type

    conf

  • DOI
    10.1109/DRC.1999.806307
  • Filename
    806307