• DocumentCode
    3335632
  • Title

    A new technique for charge dependent corrections to the time response of the drift tubes of the ATLAS experiment

  • Author

    Luise, S. Di

  • Author_Institution
    Dipt. di Fis., Univ. Roma Tre, Rome, Italy
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    738
  • Lastpage
    740
  • Abstract
    Monitored Drift Tubes (MDT), filled with a mixture of Ar : CO2 at 3 bar pressure, are used as tracking devices for the ATLAS muon spectrometer at the Large Hadron Collider. The MDT chamber tested is equipped with the final version of front-end electronics, which provides information about the collected charge through a Wilkinson ADC. We present an analysis of the signal and timing characteristics, and of charge-dependent time response of the MDTs. A new method to improve the spatial resolution of MDT chambers using the ADC information to correct the time response was developed. The procedure is based solely on the data from the MDT chamber itself. The improvement with respect to previous methods is achieved thanks to an indirect derivation of the slope of the induced anode signal. This requires an accurate determination of the response function of the ADC. Response function which is obtained by injection pulse of known charge in the integrator circuit. The method is validated with a simulation of the tube response with the Garfield program.
  • Keywords
    drift chambers; position sensitive particle detectors; ATLAS Experiment; ATLAS muon spectrometer; Garfield program; MDT chamber; Wilkinson ADC; bar pressure; charge dependent corrections; charge-dependent time response; front-end electronics; large hadron collider; monitored drift tubes; response function; spatial resolution; time response; tracking devices; Argon; Electronic equipment testing; Large Hadron Collider; Mesons; Monitoring; Signal analysis; Spatial resolution; Spectroscopy; Time factors; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402171
  • Filename
    5402171