• DocumentCode
    3335763
  • Title

    4 kV silicon carbide Schottky diodes for high-frequency switching applications

  • Author

    McGlothlin, H.M. ; Morisette, D.T. ; Cooper, J.A., Jr. ; Melloch, M.R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    1999
  • fDate
    23-23 June 1999
  • Firstpage
    42
  • Lastpage
    43
  • Abstract
    Schottky rectifiers exhibit minimal reverse recovery current, and are thus preferred over PiN diodes for high-frequency switching applications such as industrial motor controls and electric vehicle inverters. Implementation of Schottky devices in SiC material has the advantage of producing very high blocking voltages with a moderate epi thickness compared to silicon devices produced in industry today. In this report we describe the first 4 kV Schottky diodes in 4H-SiC. The development of these devices follows earlier work in which breakdown voltages of 1720 V were obtained on 13 /spl mu/m 4H-SiC epilayers.
  • Keywords
    Schottky diodes; power semiconductor diodes; power semiconductor switches; silicon compounds; solid-state rectifiers; wide band gap semiconductors; 4 kV; 4H-SiC epilayer; Schottky rectifier; SiC; blocking voltage; breakdown voltage; high-frequency switching; silicon carbide Schottky diode; Annealing; Application software; Nickel; Nitrogen; Schottky barriers; Schottky diodes; Silicon carbide; Temperature; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 1999 57th Annual
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-5170-3
  • Type

    conf

  • DOI
    10.1109/DRC.1999.806316
  • Filename
    806316