DocumentCode :
3335975
Title :
RF breakdown in low pressure gases in small (millimetric) gaps with non-planar surfaces
Author :
Legradic, B. ; Howling, A. ; Hollenstein, C.
Author_Institution :
Centre de Recherches en Phys. des Plasmas, Ecole Polytech. Federate de Lausanne (EPFL), Lausanne, Switzerland
fYear :
2010
fDate :
20-24 June 2010
Firstpage :
1
Lastpage :
1
Abstract :
Small gaps are present in plasma-enhanced chemical vapor deposition reactors to isolate the RF electrode from the grounded parts of the reactor. These gaps are supposed to be small enough so that no glow discharge can form (dark space shielding), but wide enough to avoid problems of mechanical tolerance and thermal expansion, as well as to limit large capacitive currents and prevent metal vapor arcing due to field emission. RF breakdown in these small gaps is of high interest for the thin-film industry, since arcing and parasitic plasmas in small gaps in PECVD reactors represent a failure point preventing the upscaling to larger substrates and/or higher power regimes for micro-crystalline silicon deposition.
Keywords :
arcs (electric); high-frequency discharges; plasma CVD; plasma pressure; plasma transport processes; RF breakdown; RF electrode; dark space shielding; high power regime; large capacitive current; low pressure gases; mechanical tolerance; metal vapor arcing; microcrystalline silicon deposition; nonplanar surface; parasitic plasma; plasma-enhanced chemical vapor deposition reactor; thermal expansion; thin-film industry; Chemical vapor deposition; Electric breakdown; Electrodes; Gases; Glow discharges; Inductors; Plasma chemistry; Radio frequency; Surface discharges; Thermal expansion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2010 Abstracts IEEE International Conference on
Conference_Location :
Norfolk, VA
ISSN :
0730-9244
Print_ISBN :
978-1-4244-5474-7
Electronic_ISBN :
0730-9244
Type :
conf
DOI :
10.1109/PLASMA.2010.5534421
Filename :
5534421
Link To Document :
بازگشت