• DocumentCode
    3335975
  • Title

    RF breakdown in low pressure gases in small (millimetric) gaps with non-planar surfaces

  • Author

    Legradic, B. ; Howling, A. ; Hollenstein, C.

  • Author_Institution
    Centre de Recherches en Phys. des Plasmas, Ecole Polytech. Federate de Lausanne (EPFL), Lausanne, Switzerland
  • fYear
    2010
  • fDate
    20-24 June 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Small gaps are present in plasma-enhanced chemical vapor deposition reactors to isolate the RF electrode from the grounded parts of the reactor. These gaps are supposed to be small enough so that no glow discharge can form (dark space shielding), but wide enough to avoid problems of mechanical tolerance and thermal expansion, as well as to limit large capacitive currents and prevent metal vapor arcing due to field emission. RF breakdown in these small gaps is of high interest for the thin-film industry, since arcing and parasitic plasmas in small gaps in PECVD reactors represent a failure point preventing the upscaling to larger substrates and/or higher power regimes for micro-crystalline silicon deposition.
  • Keywords
    arcs (electric); high-frequency discharges; plasma CVD; plasma pressure; plasma transport processes; RF breakdown; RF electrode; dark space shielding; high power regime; large capacitive current; low pressure gases; mechanical tolerance; metal vapor arcing; microcrystalline silicon deposition; nonplanar surface; parasitic plasma; plasma-enhanced chemical vapor deposition reactor; thermal expansion; thin-film industry; Chemical vapor deposition; Electric breakdown; Electrodes; Gases; Glow discharges; Inductors; Plasma chemistry; Radio frequency; Surface discharges; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2010 Abstracts IEEE International Conference on
  • Conference_Location
    Norfolk, VA
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-5474-7
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2010.5534421
  • Filename
    5534421