DocumentCode
3335975
Title
RF breakdown in low pressure gases in small (millimetric) gaps with non-planar surfaces
Author
Legradic, B. ; Howling, A. ; Hollenstein, C.
Author_Institution
Centre de Recherches en Phys. des Plasmas, Ecole Polytech. Federate de Lausanne (EPFL), Lausanne, Switzerland
fYear
2010
fDate
20-24 June 2010
Firstpage
1
Lastpage
1
Abstract
Small gaps are present in plasma-enhanced chemical vapor deposition reactors to isolate the RF electrode from the grounded parts of the reactor. These gaps are supposed to be small enough so that no glow discharge can form (dark space shielding), but wide enough to avoid problems of mechanical tolerance and thermal expansion, as well as to limit large capacitive currents and prevent metal vapor arcing due to field emission. RF breakdown in these small gaps is of high interest for the thin-film industry, since arcing and parasitic plasmas in small gaps in PECVD reactors represent a failure point preventing the upscaling to larger substrates and/or higher power regimes for micro-crystalline silicon deposition.
Keywords
arcs (electric); high-frequency discharges; plasma CVD; plasma pressure; plasma transport processes; RF breakdown; RF electrode; dark space shielding; high power regime; large capacitive current; low pressure gases; mechanical tolerance; metal vapor arcing; microcrystalline silicon deposition; nonplanar surface; parasitic plasma; plasma-enhanced chemical vapor deposition reactor; thermal expansion; thin-film industry; Chemical vapor deposition; Electric breakdown; Electrodes; Gases; Glow discharges; Inductors; Plasma chemistry; Radio frequency; Surface discharges; Thermal expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2010 Abstracts IEEE International Conference on
Conference_Location
Norfolk, VA
ISSN
0730-9244
Print_ISBN
978-1-4244-5474-7
Electronic_ISBN
0730-9244
Type
conf
DOI
10.1109/PLASMA.2010.5534421
Filename
5534421
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