• DocumentCode
    3335994
  • Title

    Effect of pixel dimensions and thickness on energy resolution and sensitivity of CZT detectors used in nuclear medicine application

  • Author

    Myronakis, Marios E. ; Darambara, Dimitra G.

  • Author_Institution
    Joint Dept. of Phys., Inst. of Cancer Res. & R. Marsden NHS Found. Trust, London, UK
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    2381
  • Lastpage
    2382
  • Abstract
    Cadmium zinc telluride (CZT) is considered a promising material in detector manufacturing for gamma-ray imaging. The potential of using CZT detectors with pixellated anodes to fulfill the requirements of better spatial and energy resolution as well as higher sensitivity has not been yet fully investigated. Pixellated anodes are advantaged by the small pixel effect but are susceptible to charge sharing and photon scattering within the detector especially in smaller pixel dimensions. In the current work, we combine the finite element method (FEM) and Monte Carlo simulations to model charge transport and photon interactions in the detector. The effect of pixel size on energy resolution and sensitivity was investigated for pixel pitch size from 0.4 up to 1.6 mm and for 5 and 10 mm thickness under 140 and 511 keV photon irradiation.
  • Keywords
    Monte Carlo methods; finite element analysis; radioisotope imaging; semiconductor counters; CZT detectors; Monte Carlo simulations; cadmium zinc telluride; energy resolution; finite element method; gamma-ray imaging; nuclear medicine application; photon irradiation; photon scattering; pixel dimensions; pixel pitch size; pixel thickness; pixellated anodes; sensitivity; spatial resolution; Anodes; Cadmium compounds; Electromagnetic scattering; Energy resolution; Gamma ray detection; Gamma ray detectors; Manufacturing; Nuclear imaging; Nuclear medicine; Zinc compounds; CZT; imaging; pet/spect; pixel; simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402189
  • Filename
    5402189