Title :
AlAs/sub 0.56/Sb/sub 0.44//In/sub 0.53/Ga/sub 0.47/As doped multi-channel field effect transistors
Author :
Dumka, D.C. ; Cueva, G. ; Adesida, I. ; Hier, H.S. ; Aina, O.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
Summary form only given. Microwave and millimeter wave amplifiers for wireless and space applications need semiconductor devices with high current density and wide gain linearity. Heterostructure-based doped channel field effect transistors (DCFETs) are very promising devices for such applications. In this work, we have grown AlAs/sub 0.56/Sb/sub 0.44//In/sub 0.53/Ga/sub 0.47/As lattice-matched to InP with multiple doped channels using molecular beam epitaxy (MBE) and fabricated DCFETs with variable gate length (0.2 to 1.0 /spl mu/m) on the heterostructure. The multichannel structure is used to achieve a wide gain linearity as well as high current density. In this paper, we present our results of multi-channel DCFETs with variable gate lengths. To the best of our knowledge, these are the first reported results of DCFETs on the AlAsSb/InGaAs material system.
Keywords :
III-V semiconductors; aluminium compounds; antimony compounds; arsenic compounds; current density; gallium arsenide; indium compounds; microwave field effect transistors; millimetre wave field effect transistors; molecular beam epitaxial growth; semiconductor device noise; 0.2 to 1 micron; 20 to 155 GHz; AlAs/sub 0.56/Sb/sub 0.44/-In/sub 0.53/Ga/sub 0.47/As-InP; AlAsSb/InGaAs material system; DC performance; EHF; HFET; InP; InP substrate; MBE growth; RF performance; SHF; doped multi-channel FETs; heterostructure FET; high current density; molecular beam epitaxy; multichannel structure; noise performance; variable gate lengths; wide gain linearity; Current density; FETs; Linearity; Microwave amplifiers; Microwave devices; Millimeter wave devices; Millimeter wave transistors; Molecular beam epitaxial growth; Semiconductor devices; Semiconductor optical amplifiers;
Conference_Titel :
Device Research Conference Digest, 1999 57th Annual
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-5170-3
DOI :
10.1109/DRC.1999.806353