• DocumentCode
    3336401
  • Title

    A new methodology for isolating and diagnosing inconsistencies in image matching, as applied to the analysis of 2-D electrophoretic gels

  • Author

    Markovich, Gail ; Skolnick, Michael ; Core, Mark

  • Author_Institution
    Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    1992
  • fDate
    30 Nov-2 Dec 1992
  • Firstpage
    197
  • Lastpage
    204
  • Abstract
    An image comparison algorithm employing a new notion of match consistency has been developed for the application of mutation detection on images of two-dimensional electrophoretic gels. The application requires a very high degree of accuracy in image comparison due to the rareness of mutation. The image comparison algorithm achieves high accuracy through monitoring, isolating and diagnosing inconsistencies in the matching process. The methodology is based on algorithms for monitoring symmetry relations between match hypothesis made during the course of processing. Algorithms are given which explore violations of the basic symmetry relation. Diagnostic procedures partition symmetry violations into classes that are identified with the failure of certain essential heuristics within the comparison algorithm. This methodology provides the basis for understanding and overcoming the limitations of these heuristics in order to achieve higher accuracy
  • Keywords
    biology computing; image recognition; 2D gels; accuracy; basic symmetry relation; consistency framework; electrophoretic gels; image comparison algorithm; image matching; match consistency; match hypothesis; mutation detection; symmetry relations; symmetry violations; two-dimensional electrophoretic gels; Algorithm design and analysis; Application software; Computer science; Genetic mutations; Image analysis; Image matching; Inference algorithms; Monitoring; Proteins; Two dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Computer Vision, Proceedings, 1992., IEEE Workshop on
  • Conference_Location
    Palm Springs, CA
  • Print_ISBN
    0-8186-2840-5
  • Type

    conf

  • DOI
    10.1109/ACV.1992.240311
  • Filename
    240311