Title :
Low leakage power in sub-45nm with multiple threshold voltages and multiple gate-oxide thickness footed domino circuits
Author :
Pandey, A.K. ; Mishra, R.A. ; Nagaria, R.K.
Author_Institution :
Dept. of Electron. & Commun. Eng., Motilal Nehru Nat. Inst. of Technol., Allahabad, India
Abstract :
A circuit technique is proposed in this paper for simultaneously reducing both subthreshold and gate-oxide leakage power consumption at high and low temperatures in footed domino logic circuits. A high Vt pMOS pull-up technique with feedback control utilizing both multiple-Vt and multiple Tox is added between the footer node and dynamic node to place footed domino logic circuit into a low leakage state. At 110oC, proposed work improves 34%-50% as compared to multiple-Vt with low and high inputs. At room temperatures, proposed work improves 20%-27% as compared to multiple-Vt with low and high inputs.
Keywords :
CMOS logic circuits; feedback; logic circuits; circuit technique; feedback control; gate-oxide leakage power consumption; high Vt pMOS pull-up technique; multiple Tox; multiple gate-oxide thickness footed domino logic circuit; multiple threshold voltage footed domino logic circuit; multiple-Vt; size 45 nm; subthreshold leakage power consumption; temperature 110 degC; temperature 293 K to 298 K; Leakage current; Logic gates; MOSFETs; Power demand; Subthreshold current; Dual-Vt; Footed Domino logic; Gate-Oxide Leakage Current; Subthreshold Leakage Current;
Conference_Titel :
Engineering (NUiCONE), 2011 Nirma University International Conference on
Conference_Location :
Ahmedabad, Gujarat
Print_ISBN :
978-1-4577-2169-4
DOI :
10.1109/NUiConE.2011.6153272