DocumentCode
3336621
Title
Dependability assessment using binary decision diagrams (BDDs)
Author
Doyle, S.A. ; Dugan, Joanne Bechta
Author_Institution
Dept. of Comput. Sci., Duke Univ., Durham, NC, USA
fYear
1995
fDate
27-30 June 1995
Firstpage
249
Lastpage
258
Abstract
Presents the DREDD (Dependability and Risk Evaluation using Decision Diagrams) algorithm which incorporates coverage modeling into a BDD solution of a combinatorial model. BDDs, which do not use cutsets to generate system unreliability, can be used to find exact solutions for extremely large systems. The DREDD algorithm takes advantage of the efficiency of the BDD solution approach and increases the accuracy of a combinatorial model by including consideration of imperfect coverage. The usefulness of combinatorial models, long appreciated for their logical structure and concise representational form, is extended to include many fault-tolerant systems previously thought to require more complicated analysis techniques in order to include coverage modeling. In. This paper, the DREDD approach is presented and applied to the analysis of two sample systems, the F18 flight control system and a fault-tolerant multistage interconnection network.<>
Keywords
combinatorial mathematics; diagrams; fault tolerant computing; multistage interconnection networks; reliability theory; DREDD algorithm; F18 flight control system; accuracy; binary decision diagrams; combinatorial model; coverage modeling; dependability assessment; efficiency; exact solutions; extremely large systems; fault tolerant systems; fault-tolerant multistage interconnection network; imperfect coverage; risk evaluation; system unreliability; Aerospace control; Binary decision diagrams; Boolean functions; Computer network reliability; Computer science; Data structures; Fault tolerance; Fault tolerant systems; Fault trees; Multiprocessor interconnection networks;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1995. FTCS-25. Digest of Papers., Twenty-Fifth International Symposium on
Conference_Location
Pasadena, CA, USA
Print_ISBN
0-8186-7079-7
Type
conf
DOI
10.1109/FTCS.1995.466973
Filename
466973
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