• DocumentCode
    3336751
  • Title

    Feasibility and effectiveness of the algorithm for overhead reduction in analog checkers

  • Author

    Yingquan Zhou ; Wong, M.W.T. ; Yinghua Min

  • Author_Institution
    Inst. of Comput. Technol., Acad. Sinica, Beijing, China
  • fYear
    1995
  • fDate
    27-30 June 1995
  • Firstpage
    238
  • Lastpage
    247
  • Abstract
    Self-checking in analog circuits is more difficult than in digital circuits. The technique proposed by A. Chatterjee (1993) can address concurrent error detection and correction in linear analog circuits and hence the reliability of the original circuit is greatly improved. However, hardware overhead is an important issue in this technique, which has never been addressed before. This paper proposes an algorithm for reduction of hardware overhead in the analog checker, and also presents a series of theoretical results, including the concept of all-non-zero solutions and several existence conditions of such solutions. As the basis of the algorithm, these results are new in the mathematical world and can be used to verify the feasibility and effectiveness of the algorithm. Without changing the original circuit, the proposed algorithm can not only reduce the number of passive elements, but also the number of analog operators so that the error detection circuitry in the checker has optimal hardware overhead.<>
  • Keywords
    analogue circuits; error detection; fault diagnosis; logic testing; all-non-zero solutions; analog checkers; analog operators; circuit reliability; error correction; error detection; hardware overhead reduction; linear analog circuits; passive elements; self-checking; solution existence conditions; Analog circuits; Analog computers; Circuit faults; Digital circuits; Electrical fault detection; Error correction; Fault detection; Fault tolerance; Hardware; Reliability engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1995. FTCS-25. Digest of Papers., Twenty-Fifth International Symposium on
  • Conference_Location
    Pasadena, CA, USA
  • Print_ISBN
    0-8186-7079-7
  • Type

    conf

  • DOI
    10.1109/FTCS.1995.466974
  • Filename
    466974