DocumentCode
3336837
Title
Ultrasonic scatterer structure classification with the generalized spectrum
Author
Donohue, Kevin D. ; Huang, Lexun
Author_Institution
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Volume
6
fYear
2001
fDate
2001
Firstpage
3401
Abstract
Ultrasonic back-scattered shoes resulting from the structures within a scanned object contain information of potential diagnostic value. The most common nondestructive evaluation (NDE) techniques use large-scale changes in the back-scatterer coefficients to reveal boundaries between materials with different density/elasticity properties or defects in homogenous material regions. Less common techniques consider small-scale scatterer characteristics that give rise to textures and other features not readily seen in the A-scan envelope or intensity image. This paper considers applying the generalized spectrum (GS) for classifying small-scale scatterer structures into three broad categories, diffuse, specular, and regular. The GS distinguishes between stationary (diffusion scattering) and certain classes of nonstationary processes based on a statistical characterization of the phase spectrum, and the GS can be normalized to limit variations due to frequency selectivity of the scatterers and the ultrasonic propagation path. This paper explains how the GS can be applied to classify scatterer structures over small sections of the ultrasonic A-scan and demonstrates its classification performance with simulations. The significance of the approach to NDE applications, such as flaw detection in homogenous material and material characterization in more complex material, is also discussed
Keywords
backscatter; electromagnetic wave scattering; flaw detection; spectral analysis; statistical analysis; ultrasonic materials testing; ultrasonic propagation; NDE techniques; back-scattered shoes; diffusion scattering; flaw detection; generalized spectrum; homogenous material; nondestructive evaluation; nonstationary processes; phase spectrum; regular scattering; small-scale scatterer structures; specular scattering; statistical characterization; structure classification; ultrasonic propagation path; ultrasonic scatterer; Elasticity; Energy resolution; Frequency; Inspection; Large-scale systems; Material properties; Random processes; Scattering parameters; Signal resolution; Ultrasonic transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics, Speech, and Signal Processing, 2001. Proceedings. (ICASSP '01). 2001 IEEE International Conference on
Conference_Location
Salt Lake City, UT
ISSN
1520-6149
Print_ISBN
0-7803-7041-4
Type
conf
DOI
10.1109/ICASSP.2001.940571
Filename
940571
Link To Document