DocumentCode :
3336856
Title :
Study on effect of charge sharing events in common-grid pixelated CdZnTe detectors
Author :
Kim, Jae Cheon ; Anderson, Stephen E. ; Kaye, Willy ; Kaye, Sonal Joshi ; Zhu, Yuefeng ; Zhang, Feng ; He, Zhong
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
1640
Lastpage :
1646
Abstract :
Due to the steering grid that aids the collection of electrons by the anode pixels, the common-grid pixelated CdZnTe (CZT) detectors have demonstrated better performance than simple pixel detectors. For a detailed analysis of charge sharing and weighting potential cross-talk that occurs near and underneath the gap and energy resolution degradation in common-grid CZT detectors, a detailed detector system modeling package has been developed and a related experiment using a sub-pixel interaction position estimation method has been performed. A 20×20×15 mm3 CZT crystal with an 11×11 common-grid pixel anode array with a 1.72 mm pixel pitch was modeled. The VAS_UM/TAT4 chip is used for ASIC readout. Through system modeling and measurement, the energy resolution degradation and system properties of common-grid CZT detectors has been studied quantitatively.
Keywords :
application specific integrated circuits; cadmium compounds; modelling; position sensitive particle detectors; readout electronics; semiconductor counters; ASIC readout; CdZnTe; CdZnTe detectors; VAS_UM-TAT4 chip; charge sharing effects; common grid pixelated CZT detectors; detector system modeling package; interaction position estimation method; size 15 mm; size 20 mm; steering grid; weighting potential cross talk; Anodes; Application specific integrated circuits; Degradation; Detectors; Electrons; Energy resolution; Event detection; Modeling; Packaging; Performance analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402243
Filename :
5402243
Link To Document :
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