DocumentCode :
3337039
Title :
Microstructure of (Bi0,25Sb0,75)2Te3 profiled crystals grown by directed crystallization method
Author :
Manyakin, S.M. ; Polkov, M.P.
Author_Institution :
Crystal Co. Ltd, Moscow Region, Russia
fYear :
2002
fDate :
25-29 Aug. 2002
Firstpage :
21
Lastpage :
23
Abstract :
Profiled (Bi0.25Sb0.75)2Te3-polycrystals in the form of flat plates were grown by directed crystallization method. Microstructure peculiarities of crystals were studied. It was shown that heat treatments at 300-600°C-temperature range led to some changes in the state of tellurium-enriched phase. These changes were explained by the character of Bi-Sb-Te phase diagram near to (Bi0.25Sb0.75)2Te3 compositions.
Keywords :
annealing; antimony compounds; bismuth compounds; crystallisation; phase diagrams; scanning electron microscopy; semiconductor materials; (Bi0,2Sb0,75)2Te3 profiled crystals; (Bi0.25Sb0.75)2Te3; 300 to 600 degC; Bi-Sb-Te phase diagram; directed crystallization method; heat treatments; microstructure; Annealing; Bismuth; Crystal microstructure; Crystalline materials; Crystallization; Heat treatment; Solids; Tellurium; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2002. Proceedings ICT '02. Twenty-First International Conference on
Print_ISBN :
0-7803-7683-8
Type :
conf
DOI :
10.1109/ICT.2002.1190256
Filename :
1190256
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3337039
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