• DocumentCode
    3337039
  • Title

    Microstructure of (Bi0,25Sb0,75)2Te3 profiled crystals grown by directed crystallization method

  • Author

    Manyakin, S.M. ; Polkov, M.P.

  • Author_Institution
    Crystal Co. Ltd, Moscow Region, Russia
  • fYear
    2002
  • fDate
    25-29 Aug. 2002
  • Firstpage
    21
  • Lastpage
    23
  • Abstract
    Profiled (Bi0.25Sb0.75)2Te3-polycrystals in the form of flat plates were grown by directed crystallization method. Microstructure peculiarities of crystals were studied. It was shown that heat treatments at 300-600°C-temperature range led to some changes in the state of tellurium-enriched phase. These changes were explained by the character of Bi-Sb-Te phase diagram near to (Bi0.25Sb0.75)2Te3 compositions.
  • Keywords
    annealing; antimony compounds; bismuth compounds; crystallisation; phase diagrams; scanning electron microscopy; semiconductor materials; (Bi0,2Sb0,75)2Te3 profiled crystals; (Bi0.25Sb0.75)2Te3; 300 to 600 degC; Bi-Sb-Te phase diagram; directed crystallization method; heat treatments; microstructure; Annealing; Bismuth; Crystal microstructure; Crystalline materials; Crystallization; Heat treatment; Solids; Tellurium; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2002. Proceedings ICT '02. Twenty-First International Conference on
  • Print_ISBN
    0-7803-7683-8
  • Type

    conf

  • DOI
    10.1109/ICT.2002.1190256
  • Filename
    1190256
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3337039