DocumentCode :
3337172
Title :
Evaluation of HPK and FBK silicon photomultipliers for TOF and PET applications
Author :
Ambrosi, G. ; Azzarello, P. ; Battiston, R. ; Ionica, M. ; Pignatel, G.U.
Author_Institution :
Nat. Inst. of Nucl. Phys., Perugia, Italy
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
1566
Lastpage :
1571
Abstract :
In time-of-flight (TOF) measurements, or positron emission tomography (PET) experiments where two gamma rays are emitted in coincidence, the time resolution of the photon detector is of primary importance. SIPMs are very promising devices for these applications, since their intrinsic response time is very short, typically less than 1ns. In practice, the actual timing resolution of SIPMs is affected by the area (capacitance) of the device, by the type of electronics used to pre-amplify the signal, by the dark count rate which is viewed as background noise, and other second order effects like cross-talk and after dark pulsing. In this work we report the characteristics of different samples of Hamamatsu Photonics (HPK) and Fondazione Bruno Kessler (FBK) SIPMs, with pixel size ranging from 40 to 100 micron. In particular, we have investigated the time response when stimulated with O(100) ps pulsed laser with a wavelength of 407nm. Finally, SIPM performances are compared with that of fast silicon PIN diodes characterized with the same setup.
Keywords :
nuclear electronics; p-i-n diodes; photomultipliers; positron emission tomography; radiation detection; scintillation counters; FBK silicon photomultiplier; HPK silicon photomultiplier; SIPM performances; background noise; dark count rate; dark pulsing; gamma rays; intrinsic response time; photon detector; pixel size; positron emission tomography experiments; pulsed laser; silicon PIN diodes; time resolution; time response; time-of-flight measurements; Delay; Gamma ray detection; Gamma ray detectors; Gamma rays; Photomultipliers; Positron emission tomography; Silicon; Single photon emission computed tomography; Time measurement; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402263
Filename :
5402263
Link To Document :
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