DocumentCode :
3337423
Title :
The effect of crystal grain size on thermoelectric properties of sintered β-FeSi2
Author :
Isoda, Yukihiro ; Imai, Yoshio ; Shinohara, Yoshikam
Author_Institution :
Nat. Inst. for Mater. Sci., Ibaraki, Japan
fYear :
2002
fDate :
25-29 Aug. 2002
Firstpage :
102
Lastpage :
105
Abstract :
The effects of crystal grain sizes on the thermoelectric properties were investigated for sintered β-FeSi2 doped with Mn or Co. Sintered materials of β-FeSi2 doped with Mn or Co were prepared by the cold-pressing and sintering technique. The mean powder size d, sintered grain size Cs and annealed grain size Ca decreased exponentially with increasing ball-milling duration. The mean crystal grain sizes (Cs and Ca) of FeSi2 doped with Mn were larger than that of Co-doped specimen after sintering and annealing. The Seebeck coefficient α and electrical resistivity ρ of Mn-doped p-type FeSi2 increases with Ca. On the other hand, α of Co-doped n-type FeSi2 is independent of Ca, while ρ decreases with increasing Ca. The Hall mobilities of p- and n-type FeSi2 specimens were approximately independent of Ca. For p-type FeSi2, the carrier concentration nH decreased with increasing Ca, whereas nH of n-type FeSi2 increased with Ca. This result shows that the Ca dependence of the α and ρ is similar to the nH dependence. For p-type FeSi2, the increase in nH with decreasing Ca is due to the holes formed in grain boundaries. For n-type FeSi2, the decrease in n11 with decreasing Ca is due to the carrier compensation.
Keywords :
Hall mobility; Seebeck effect; carrier density; cold working; electrical resistivity; grain boundaries; grain size; iron compounds; powder technology; semiconductor materials; sintering; FeSi2; Hall mobility; Seebeck coefficient; ball-milling; carrier compensation; carrier concentration; cold-pressing; crystal grain size; electrical resistivity; grain boundaries; sintered β-FeSi2; thermoelectric properties; Annealing; Contamination; Crystalline materials; Grain size; Iron; Manganese; Powders; Semiconductor device doping; Silicon; Thermoelectricity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2002. Proceedings ICT '02. Twenty-First International Conference on
Print_ISBN :
0-7803-7683-8
Type :
conf
DOI :
10.1109/ICT.2002.1190275
Filename :
1190275
Link To Document :
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