DocumentCode
3337564
Title
Voronoi tessellated halftone masks
Author
Garateguy, G.J. ; Arce, G.R. ; Lau, D.L.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Delaware, Newark, DE, USA
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
529
Lastpage
532
Abstract
A new algorithm to build blue noise masks using centroidal Voronoi tessellations (CVT) and a variant of Lloyd´s Algorithm is presented. The algorithm takes advantage of the optimality properties of CVTs and through a modified version of Lloyd´s algorithm, achieves optimization of the stacked binary patterns that build the mask. A new ordering for binary pattern design is presented, as well as a new metric that allows the creation of quality profiles of the masks. The masks generated by this method are used to halftone sample images, and quality profiles are created. It is shown that CVT masks outperform masks created by DBS and VaC according to the new metric defined and thorough visual inspection of halftoned images.
Keywords
computational geometry; image sampling; Lloyd´s algorithm; binary pattern design; blue noise masks; centroidal Voronoi tessellations; halftone sample images; Algorithm design and analysis; Measurement; Noise; Optimization; Pixel; Satellite broadcasting; Stacking; Blue-noise masking; Cell aspect ratio measure; Centroidal Voronoi tessellations; Halftoning;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5651703
Filename
5651703
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