Title :
Hydrothermal synthesis and characterization of nano Gd2O3(Eu) scintillator for high resolution X-ray imaging application
Author :
Muralidhran, P. ; Lee, Seung Jun ; Cha, Bo Kyung ; Kim, Jong Yul ; Kim, Chan Kyu ; Kim, Do Kyung ; Cho, Gyuseong
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
Gd2O3:Eu scintillators with nano-crystalline structures were successfully synthesized through a hydrothermal process and subsequent calcination treatment as a converter for X-ray imaging detectors. In this work, Eu-doped Gd2O3 nano-crystalline powders as a function of calcination temperatures and times were prepared by a hydrothermal process and subsequent calcination in the electrical furnace. Scintillation properties such as luminescent spectra, light intensity and decay time were measured by changing the temperatures and times in heat-treatment of as-synthesized nanocrystalline powders. The synthesized samples with different morphology such as nano rods and particles due to calcination temperature were observed. The sample prepared at 1100°C calcination temperature and 5 hour showed the highest light intensity by X-ray excitation. And the scintillator emitted a strong red light at near 611nm under photo-and X-ray luminescence for its potential X-ray imaging detector applications.
Keywords :
X-ray imaging; calcination; crystal growth from solution; photoluminescence; scintillation counters; X-ray excitation; X-ray luminescence; calcination temperatures; calcination times; calcination treatment; decay time; high resolution X-ray imaging; hydrothermal synthesis; light intensity; luminescent spectra; nano Gd2O3(Eu) scintillator; nano rods; nano-crystalline structures; nanocrystalline powders; photoluminescence; Calcination; Furnaces; Nanostructures; Powders; Solid scintillation detectors; Temperature; Time measurement; X-ray detection; X-ray detectors; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402297