DocumentCode :
333788
Title :
Discriminating at-risk post-MI patients by fractal dimension analysis of the late potential attractor
Author :
Mitchell, R.H. ; Escalona, O.
Author_Institution :
Ulster Univ., Jordanstown, UK
Volume :
3
fYear :
1998
fDate :
29 Oct-1 Nov 1998
Firstpage :
1573
Abstract :
A novel and reliable approach which quantifies the degree of complexity of late potential (LP) activity in the time domain is presented. By defining the LP attractor in the microvoltage, 3-dimensional space, and then computing the fractal dimension (δ) of the attractor´s trajectory, the degree of complexity of LP can be quantified with a single parameter. δ may indicate the chaotic behaviour of the terminal activity of the ventricular depolarisation process. The fractal dimension of the LP Attractor in post-MI subjects that are at risk is significantly higher than in post-MI subjects with low LP activity (p<0.001). δ may be considered as the criterion for discrimination. Fractal dimension analysis on LP is a novel diagnostic approach aimed at quantifying their complexity in the microvoltage 3-D space, and may be interpreted as a measure of their chaotic behaviour triggering a catastrophic arrhythmic episode
Keywords :
bioelectric potentials; chaos; electrocardiography; filtering theory; fractals; medical signal detection; medical signal processing; phase space methods; at-risk post-MI patients discrimination; catastrophic arrhythmic episode; degree of complexity; deterministic chaos; fractal dimension analysis; high-pass filtering; late potential activity; late potential attractor; microvoltage 3D space; myocardial infarct; phase space; single parameter; terminal activity; time domain; ventricular depolarisation process; Chaos; Delay; Electrocardiography; Extraterrestrial measurements; Fractals; Frequency; H infinity control; Signal analysis; Size measurement; Stochastic processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location :
Hong Kong
ISSN :
1094-687X
Print_ISBN :
0-7803-5164-9
Type :
conf
DOI :
10.1109/IEMBS.1998.747193
Filename :
747193
Link To Document :
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