• DocumentCode
    3337961
  • Title

    Active integrated fault localization in communication networks

  • Author

    Tang, Yongning ; Al-Shaer, Ehab S. ; Boutaba, Raouf

  • Author_Institution
    Sch. of Comput. Sci., DePaul Univ., USA
  • fYear
    2005
  • fDate
    15-19 May 2005
  • Firstpage
    543
  • Lastpage
    556
  • Abstract
    Fault localization is a core element in fault management. Many fault reasoning techniques use deterministic or probabilistic symptom-fault causality model for fault diagnoses and localization. Symptom-fault map is commonly used to describe symptom-fault causality in fault reasoning. However, due to lost and spurious symptoms in fault reasoning systems that passively collect symptoms, the performance and accuracy of the fault localization can be significantly degraded. In this paper, we propose an extended symptom-fault-action model to incorporate actions into fault reasoning process to tackle the above problem. This technique is called active integrated fault reasoning (AIR), which contains three modules: fault reasoning, fidelity evaluation and action selection. Corresponding fault reasoning and action selection algorithms are elaborated. Simulation study shows both performance and accuracy of fault reasoning can be greatly improved by taking actions, especially when the rate of spurious and lost symptoms is high.
  • Keywords
    fault location; probability; telecommunication network management; telecommunication network reliability; action selection; active integrated fault localization; communication networks; fault management; fault reasoning process; fidelity evaluation; probabilistic symptom-fault causality model; symptom-fault map; symptom-fault-action model; Communication networks; Computer science; Degradation; Fault detection; Fault diagnosis; Inference algorithms; Intelligent networks; Iron; Large-scale systems; Monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Network Management, 2005. IM 2005. 2005 9th IFIP/IEEE International Symposium on
  • Print_ISBN
    0-7803-9087-3
  • Type

    conf

  • DOI
    10.1109/INM.2005.1440826
  • Filename
    1440826