Title :
Interconnect modeling and signal integrity issues II
Author_Institution :
Lucent Technologies
Keywords :
Circuit noise; Coupling circuits; Electric variables control; Integrated circuit interconnections; Negative feedback; Noise reduction; Voltage control;
Conference_Titel :
ASIC/SOC Conference, 1999. Proceedings. Twelfth Annual IEEE International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5632-2
DOI :
10.1109/ASIC.1999.806471
