Title :
Efficient modeling techniques for IR drop analysis in ASIC designs
Author :
Cho, Dong-Soo ; Lee, Kyung-Ho ; Jang, Gi-Jeong ; Kim, Taek-Soo ; Kong, Jeong-Taek
Author_Institution :
Semicond. R&D Center, Samsung Electron. Co. Ltd., South Korea
Abstract :
In this paper, we propose efficient modeling techniques for analyzing power distribution in deep submicron (DSM) ASIC designs. VCCS (Voltage Controlled Current Source) and equivalent conductance modeling techniques are the key concepts in our approach, which provide the same analysis results as the original resistive network with two orders of magnitude speedup. In addition, soft-macro power consumption modeling is proposed to enable the analysis at the floorplan stage. Experimental results show that the power distribution analysis based on the proposed modeling techniques at the floorplan stage yields less than 5% error compared to the post-layout power analysis
Keywords :
VLSI; application specific integrated circuits; circuit layout CAD; delays; integrated circuit layout; integrated circuit modelling; integrated circuit reliability; power supply circuits; ASIC designs; IR drop analysis; VCCS; deep submicron ASIC; equivalent conductance modeling techniques; floorplan stage; modeling techniques; power distribution; power distribution analysis; resistive network; soft-macro power consumption modeling; Application specific integrated circuits; Circuit simulation; Energy consumption; Performance analysis; Power distribution; Power supplies; Research and development; Switching frequency; Voltage; Wires;
Conference_Titel :
ASIC/SOC Conference, 1999. Proceedings. Twelfth Annual IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5632-2
DOI :
10.1109/ASIC.1999.806475