DocumentCode
3338276
Title
Optical properties of epitaxial PbTiO3 thin film on (001) MgO
Author
Sun, Li ; Chen, Yanfeng ; Yu, Tao ; Ge, Chuanzheng ; Yang, Zhengju ; Ming, Naiben
Author_Institution
Lab. of Solid State Microstructures, Nanjing Univ., China
fYear
1996
fDate
25-30 Sep 1996
Firstpage
401
Lastpage
405
Abstract
(001) preferentially oriented PbTiO3 thin films have been deposited on (001) magnesium oxide (MgO) single-crystal substrate by metal-organic chemical vapor deposition (MOCVD) under reduced pressure at 650°C. Their optical properties were investigated by optical waveguiding and optical transmission measurements. A favorable optical waveguiding property has been demonstrated in the as-deposited films by the observation of an m-line from the TE and TM modes. The film refractive index dependence on wavelength is analyzed from the transmission spectrum and is found to be less than the bulk material
Keywords
X-ray diffraction; epitaxial layers; ferroelectric thin films; infrared spectra; lead compounds; optical films; optical waveguides; refractive index; transmission electron microscopy; vapour phase epitaxial growth; visible spectra; (001) MgO substrate; 650 C; MOCVD; MgO; MgO single-crystal substrate; PbTiO3; TE mode; TEM; TM mode; XRD; epitaxial PbTiO3 thin film; ferroelectric; m-line; metal-organic chemical vapor deposition; optical properties; optical transmission; optical waveguiding property; reduced pressure; refractive index; wavelength dependence; Chemical vapor deposition; MOCVD; Magnesium oxide; Optical films; Optical refraction; Optical variables control; Sputtering; Substrates; Tellurium; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 1996. (ISE 9), 9th International Symposium on
Conference_Location
Shanghai
Print_ISBN
0-7803-2695-4
Type
conf
DOI
10.1109/ISE.1996.578113
Filename
578113
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