Title :
Notice of Retraction
Reaction Mechanism and Influence Factors of Ethylenediamine Wastewater Treated by Supercritical Water Oxidation
Author :
Jiaming Zhang ; Chunyuan Ma
Author_Institution :
Sch. of Environ. Sci. & Eng., Shandong Univ., Jinan, China
Abstract :
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
The experiments were carried on the treatment of Ethylenediamine (EDA) wastewater by supercritical water oxidation (SCWO). The effect of factors including reaction temperature, pressure, residence time and O2 stoichiometric ratio on the EDA decomposition were studied. And the radical reaction mechanism was used to explain the decomposition process of EDA by SCWO. The results found that SWCO can destruct the organic compounds in EDA wastewater into CO2 and N2. With increasing of reaction temperature, pressure, residence time, and decreasing of initial TOC concentration, TOC conversion increased. When the O2 stoichiometric ratio is below 1.5, the change of O2 stoichiometric ratio could influence the TOC conversion significantly. When the reaction temperature is above 535°C and residence time is over 120 s, the TOC conversion of EDA is above 98%.
Keywords :
organic compounds; oxidation; stoichiometry; wastewater treatment; EDA decomposition process; TOC concentration; TOC conversion; ethylenediamine wastewater treatment; organic compounds; radical reaction mechanism; reaction pressure; reaction temperature; residence time; stoichiometric ratio; supercritical water oxidation; Chemicals; Inductors; Oxidation; Temperature; Wastewater; Water; Water pollution;
Conference_Titel :
Bioinformatics and Biomedical Engineering, (iCBBE) 2011 5th International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5088-6
DOI :
10.1109/icbbe.2011.5781134