DocumentCode :
3338543
Title :
Sequential probability ratio test using scaled time-intervals for environmental radiation monitoring
Author :
Luo, Peng ; DeVol, Timothy A. ; Sharp, Julia L.
Author_Institution :
Environ. Eng. & Earth Sci., Clemson Univ., Clemson, SC, USA
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
1372
Lastpage :
1377
Abstract :
Sequential probability ratio test (SPRT) of scaled time-interval data (time to record N radiation pulses), SPRT_scaled, was evaluated against commonly used single-interval test (SIT) and SPRT with a fixed counting interval, SPRT_fixed, on experimental and simulated data. Experimental data were acquired with a DGF-4C (XIA, Inc) system in list mode. Simulated time-interval data were obtained using Monte Carlo techniques to perform a random radiation sampling of the Poisson distribution. The three methods (SIT, SPRT_fixed and SPRT_scaled) were compared in terms of detection probability and average time to make a decision about the source of radiation. For both experimental and simulated data, SPRT_scaled provided similar detection probabilities as other tests, but is able to make a quicker decision with fewer pulses at relatively higher radiation levels. SPRT_scaled has a provision for varying the sampling time depending on the radiation level, which may further shorten the time needed for radiation monitoring. Parameter adjustments to the SPRT_scaled method for increased detection probability are discussed.
Keywords :
Monte Carlo methods; probability; radiation monitoring; radioactive pollution; signal processing; statistical analysis; Monte Carlo techniques; Poisson distributed random radiation sampling; detection probability; environmental radiation monitoring; fixed counting interval SPRT comparison; list mode DGF-4C system; radiation source; scaled time interval SPRT; sequential probability ratio test; single interval SPRT comparison; Environmental management; Geoscience; Power engineering and energy; Radiation detectors; Radiation monitoring; Sampling methods; Sequential analysis; Statistical analysis; Testing; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402340
Filename :
5402340
Link To Document :
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