Title :
Thermally-induced current injection across an n*-n junction
Author :
Hagelstein, Peter ; Kucherov, Yan
Author_Institution :
MIT, Cambridge, MA, USA
Abstract :
Experiments with thermal to electric energy conversion in diode-like thermoelectric semiconductor structures show enhanced short-circuit currents and open-circuit voltages compared with thermoelectric performance. The experimental results are consistent with a current injection effect. We review the models that we have proposed to account for the effect.
Keywords :
semiconductor junctions; short-circuit currents; thermoelectric conversion; thermoelectric devices; abrupt junction current injection; current injection effect; diode-like thermoelectric semiconductor structures; enhanced short-circuit currents; finite junction model; n*-n junction; nonlocal transport model; open-circuit voltages; thermal to electric energy conversion; thermally-induced current injection; thermoelectric performance; Circuits; Conducting materials; Current density; Scattering; Semiconductor diodes; Semiconductor materials; Solids; Temperature; Thermoelectricity; Voltage;
Conference_Titel :
Thermoelectrics, 2002. Proceedings ICT '02. Twenty-First International Conference on
Print_ISBN :
0-7803-7683-8
DOI :
10.1109/ICT.2002.1190346
