Title :
Test strategies for SoC quality
Author :
Nagvajara, Prawat ; Ryan, Colan
Author_Institution :
Drexel University
Keywords :
Bonding; Built-in self-test; Costs; Embedded system; Instruments; Performance evaluation; Pins; Signal processing; System testing; Test pattern generators;
Conference_Titel :
ASIC/SOC Conference, 1999. Proceedings. Twelfth Annual IEEE International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5632-2
DOI :
10.1109/ASIC.1999.806508
