DocumentCode :
3338925
Title :
Characteristics of a silicon on insulator neutron detector
Author :
Subramanian, Mythili ; Phlips, Bernard ; Kub, Fritz
Author_Institution :
Coll. of Sci., George Mason Univ., Fairfax, VA, USA
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
1306
Lastpage :
1309
Abstract :
We have characterized several Silicon On Insulator (SOI) devices for use as neutron detectors. SOI neutron detectors offer the advantage of a rugged structure with large area while incorporating a thin Si layer coated with a converter material. The performance of these SOI detectors depends on the thickness of the Si layer, the dimensions of the strips, on the converter material and its thickness. This paper describes the design of the SOI wafer, the characteristics of the devices on the SOI wafer and the initial testing of the devices as neutron detectors. SOI wafers of two different Si thicknesses, with varying dimensions for the strip pitch were characterized. The IV and CV properties of the different devices were studied. The devices were then coated with the converter material and used to detect neutrons. We present results from a SOI neutron detector of large surface area that is ¿ blind.
Keywords :
neutron detection; semiconductor counters; CV property; IV property; SOI neutron detectors; SOI wafer; Si thicknesses; converter material; gamma blind; insulator neutron detector; rugged structure; silicon on insulator devices; strip pitch; surface area; thin Si layer; Absorption; Detectors; Insulation; Laboratories; Neutrons; Semiconductor materials; Silicon on insulator technology; Solid state circuits; Space technology; Strips; γ blind; Semiconductor; Silicon On Insulator; thermal neutron detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402360
Filename :
5402360
Link To Document :
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