DocumentCode
3338938
Title
A low noise pixel architecture for scientific CMOS monolithic active pixel sensors
Author
Coath, Rebecca E. ; Crooks, Jamie P. ; Godbeer, Adam ; Wilson, Matthew D. ; Zhang, Zhige ; Stanitzki, Marcel ; Tyndel, Mike ; Turchetta, Renato A D
Author_Institution
Rutherford Appleton Lab., Sci. & Technol. Facilities Council, Didcot, UK
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
1310
Lastpage
1316
Abstract
This paper presents the design and characterisation of FORTIS (4T Test Image Sensor), which is a low noise, CMOS monolithic active pixel sensor for scientific applications. The pixels present in FORTIS are based around the four transistor (4T) pixel architecture, which is already widely used in the commercial imaging community. The sensor design contains thirteen different variants of the 4T pixel architecture to investigate the effects of changing its core parameters. The variants include differences in the pixel pitch, the diode size, the in-pixel source follower, and the capacitance of the floating diffusion node (the input node of the in-pixel source follower). Processing variations have also been studied, which include varying the resistivity of the epitaxial layer and investigating the effects of a special deep p-well layer. By varying these parameters, the 4T pixel architecture can be optimised for scientific applications where detection of small amounts of charge is required.
Keywords
CMOS image sensors; epitaxial layers; position sensitive particle detectors; semiconductor counters; CMOS monolithic active pixel sensors; FORTIS; diode size; epitaxial layer; floating diffusion node; four transistor pixel architecture; in-pixel source follower; low noise pixel architecture; p-well layer; pixel pitch; scientific applications; sensor design; Active noise reduction; CMOS image sensors; Capacitance; Conductivity; Diodes; Epitaxial layers; Image sensors; Pixel; Sensor phenomena and characterization; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5402361
Filename
5402361
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