A formal TTCN-based protocol testing for intelligent network

Author

Kim, Sangki ; Bae, Hyunjoo ; Jun, Kyungpyo

Author_Institution

Electron. & Telecommun. Res. Inst., Daejeon, South Korea

fYear

1998

fDate

30 Jun-2 Jul 1998

Firstpage

205

Lastpage

209

Abstract

The intelligent network is evolving from its first generation architecture to an advanced platform in Korea. In parallel with the advancement of the IN itself the protocol test technology for IN components is enhanced based on a formal approach. This paper presents our experience with the formal TTCN-based (TTCN: tree and tabular combined notation) intelligent network application conformance testing. We built an integrated test environment which supports the entire process of conformance testing such as test suite generation, test data preparation, test execution, and test result analysis. The INAP conformance test suite generated by the formal technique is verified on the simulation environment for self-testing

Keywords

automatic testing; conformance testing; digital simulation; formal verification; intelligent networks; protocols; telecommunication computing; IN components; INAP conformance test suite; Korea; SDL; conformance testing; first generation architecture; formal TTCN-based protocol testing; formal technique; integrated test environment; intelligent network; intelligent network application; self-test; simulation environment; test data preparation; test execution; test result analysis; test suite generation; tree and tabular combined notation; Consumer electronics; Government; Intelligent networks; Personal communication networks; Postal services; Protocols; Read only memory; Research and development; Telephony; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Computers and Communications, 1998. ISCC '98. Proceedings. Third IEEE Symposium on

Conference_Location

Athens

Print_ISBN

0-8186-8538-7

Type

conf

DOI

10.1109/ISCC.1998.702504

Filename

702504