DocumentCode :
3339052
Title :
PCBs thermophysical properties in lead-free assembling process assessment
Author :
Plotog, Ioan ; Branzei, Mihai ; Svasta, Paul ; Miculescu, Marian ; Cucu, Traian ; Thumm, A.
Author_Institution :
Center for Technol. Electron. & Interconnection Tech., Politeh. Univ. of Bucharest, Bucharest, Romania
fYear :
2010
fDate :
23-26 Sept. 2010
Firstpage :
29
Lastpage :
32
Abstract :
As elements of interconnection structures at level two in electronic packaging, the pads could be considered as a particular solution into a virtual space defined by the materials, geometry, surface finishes and substrate. The assembling processes emphasize the substrate contribution over thermal mass and heat transfer. Each of the pad particular solution defined in the design stage will have unique values of thermophysical properties (THP). In the paper it will be presented the results of the THP measurements for different types of PCBs having particular solutions defined by the pad finishes, geometry and substrate materials using ANTER equipments (FlashLine 3000 thermal diffusivity system and Unitherm1161V dilatometer type). Finally, scientific and practical conclusions shall be drawn in order to improve the quality, reliability and increase the energetic efficiency of the reflow soldering process.
Keywords :
assembling; extensometers; printed circuits; reflow soldering; surface finishing; thermal diffusivity; thermal management (packaging); FlashLine 3000 thermal diffusivity system; PCB thermophysical properties; Unitherm1161V dilatometer type; electronic packaging; heat transfer; lead-free assembling process assessment; pad finishes; reflow soldering; substrate contribution; surface finishes; thermal mass; Glass; Heat transfer; Heating; Soldering; Substrates; Temperature measurement; PCB substrate; pad; thermal diffusivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2010 IEEE 16th International Symposium for
Conference_Location :
Pitesti
Print_ISBN :
978-1-4244-8123-1
Type :
conf
DOI :
10.1109/SIITME.2010.5651792
Filename :
5651792
Link To Document :
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