• DocumentCode
    3339052
  • Title

    PCBs thermophysical properties in lead-free assembling process assessment

  • Author

    Plotog, Ioan ; Branzei, Mihai ; Svasta, Paul ; Miculescu, Marian ; Cucu, Traian ; Thumm, A.

  • Author_Institution
    Center for Technol. Electron. & Interconnection Tech., Politeh. Univ. of Bucharest, Bucharest, Romania
  • fYear
    2010
  • fDate
    23-26 Sept. 2010
  • Firstpage
    29
  • Lastpage
    32
  • Abstract
    As elements of interconnection structures at level two in electronic packaging, the pads could be considered as a particular solution into a virtual space defined by the materials, geometry, surface finishes and substrate. The assembling processes emphasize the substrate contribution over thermal mass and heat transfer. Each of the pad particular solution defined in the design stage will have unique values of thermophysical properties (THP). In the paper it will be presented the results of the THP measurements for different types of PCBs having particular solutions defined by the pad finishes, geometry and substrate materials using ANTER equipments (FlashLine 3000 thermal diffusivity system and Unitherm1161V dilatometer type). Finally, scientific and practical conclusions shall be drawn in order to improve the quality, reliability and increase the energetic efficiency of the reflow soldering process.
  • Keywords
    assembling; extensometers; printed circuits; reflow soldering; surface finishing; thermal diffusivity; thermal management (packaging); FlashLine 3000 thermal diffusivity system; PCB thermophysical properties; Unitherm1161V dilatometer type; electronic packaging; heat transfer; lead-free assembling process assessment; pad finishes; reflow soldering; substrate contribution; surface finishes; thermal mass; Glass; Heat transfer; Heating; Soldering; Substrates; Temperature measurement; PCB substrate; pad; thermal diffusivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology in Electronic Packaging (SIITME), 2010 IEEE 16th International Symposium for
  • Conference_Location
    Pitesti
  • Print_ISBN
    978-1-4244-8123-1
  • Type

    conf

  • DOI
    10.1109/SIITME.2010.5651792
  • Filename
    5651792