• DocumentCode
    333913
  • Title

    Microstructural Characterization Of Polycrystalline Thin Film CulnSe2: A Promising Yet Complex Material For Photovoltaic Applications.

  • Author

    Tuttle, John R. ; Albin, David S. ; Carapella, Jeff ; Noufi, Rommel

  • Author_Institution
    Solar Energy Research Institute
  • Volume
    5
  • fYear
    1990
  • fDate
    12-17 Aug 1990
  • Firstpage
    31
  • Lastpage
    36
  • Keywords
    Electron optics; Optical diffraction; Optical films; Optical materials; Optical microscopy; Photovoltaic systems; Semiconductor materials; Solar power generation; Transistors; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Engineering Conference, 1990. IECEC-90. Proceedings of the 25th Intersociety
  • Print_ISBN
    0-8169-0490-1
  • Type

    conf

  • DOI
    10.1109/IECEC.1990.747922
  • Filename
    747922
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=333913