Title :
Regularized Trace Ratio Discriminant Analysis with Patch Distribution Feature for human gait recognition
Author :
Huang, Yi ; Xu, Dong ; Nie, Feiping
Author_Institution :
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
We propose a new dimension reduction algorithm in combination with the Gaussian Mixture Model (GMM) based Patch Distribution Feature for human gait recognition. Instead of representing each average silhouette image as its gray-level feature, we first extract local patch features at every pixel of the average silhouette image and train a GMM to describe the distribution of the patches in each image. A Universal Background Model (UBM) is first trained with local patch features from all gallery images, then every gallery or probe image is represented by the distribution parameters (referred to as Patch Distribution Features (PDF)) of the image-specific GMM adapted from the UBM. To cope with the high dimension of the PDF feature, the Regularized Trace Ratio Discriminant Analysis (RTRDA) is developed to find the most discriminant subspaces for gait recognition. Experiments on USF humanID database show that RTRDA significantly outperforms the existing algorithms and achieves the best recognition results among all the previous works on USF humanID database in terms of average rank-1 recognition rate.
Keywords :
Gaussian processes; feature extraction; gait analysis; image recognition; image representation; Gaussian mixture model; USF human ID database; average rank-1 recognition rate; average silhouette image represention; dimension reduction algorithm; distribution parameter; human gait recognition; local patch feature extraction; patch distribution features; regularized trace ratio discriminant analysis; universal background model; Adaptation model; Artificial neural networks; Databases; Face recognition; Feature extraction; Humans; Probes; Gaussian Mixture Model; Human Gait Recognition; Regularized Trace Ratio Discriminant Analysis;
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2010.5651825