Title :
An on-chip fast readout sparsification for a 256-pixel 3D device
Author :
Gabrielli, A. ; Giorgi, F. ; Villa, M. ; Morsani, F.
Author_Institution :
INFN, Univ. degli Studi di Bologna, Bologna, Italy
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
A prototype of a 3D ASIC built up of a fast readout architecture, with sparsification capabilities, which interfaces with a matrix of 256 pixel sensor, was recently submitted. The chosen technology is CMOS Chartered 130 nm as it is compatible with the Tezzaron facility to interconnect fate-to-face two silicon wafers allowing for a vertical integration structure by means of through-silicon-vias. Particularly, the readout logic shares one layer of double-layer design that will be stacked at the end of the fabrication process.
Keywords :
application specific integrated circuits; nuclear electronics; position sensitive particle detectors; readout electronics; 3D ASIC; 3D application specific integrated circuits; CMOS Chartered; Tezzaron facility; double-layer design; fabrication process; fast readout architecture; on-chip fast readout sparsification; pixel sensor; readout logic; silicon wafers; vertical integration structure; Application specific integrated circuits; CMOS logic circuits; CMOS technology; Collaboration; Foundries; Logic design; Logic devices; Prototypes; Silicon; Testing;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402396