DocumentCode :
3339754
Title :
Applied stochastic network state estimation
Author :
Van de Water, Ir C J
Author_Institution :
Dept. of Electr. Power Syst., Netherlands Associate Res., Eindhoven
fYear :
2005
fDate :
18-18 Nov. 2005
Lastpage :
4
Abstract :
In the year 2000 the proof of principle for stochastic state estimation (called pseudo monitor) was demonstrated in cooperation with a Dutch utility. Motive of this network company was the decision to construct a data base for monitoring all MV feeders in the substations and prove the important monitoring capabilities of this application for operative and asset management of the network. The main problem turned out to be the collecting of load profiles. In this paper the application of gathering and appointing load profiles of the network are placed in a structure and supported by mathematical definitions. In a second demonstration project more basic know how and skill on load profiles were developed. Experience on standard profiles should be gathered before implementation of these applications in network companies takes place. This paper reaches practical solutions and invite companies to communicate about the desired future research
Keywords :
distribution networks; mathematical analysis; power system measurement; power system state estimation; stochastic processes; substations; Dutch utility; load profiles; monitoring capability; network asset management; network company; pseudomonitor; stochastic network state estimation; substation feeders; Asset management; Condition monitoring; Fluid flow measurement; Load flow; Power system analysis computing; Power system measurements; Power system modeling; State estimation; Stochastic processes; Stochastic systems; Band limited stochastic processes; Load flow analysis; Load measurement; Load modelling; Load profile recognition; Monitoring; Power system monitoring; Power system parameter estimation; Power system state estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Future Power Systems, 2005 International Conference on
Conference_Location :
Amsterdam
Print_ISBN :
90-78205-02-4
Type :
conf
DOI :
10.1109/FPS.2005.204268
Filename :
1600541
Link To Document :
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