DocumentCode
3339788
Title
Comparison of measurements of Charge Transfer Inefficiencies in a CCD with high-speed column parallel readout
Author
Sopczak, André ; Aoulmit, Salim ; Bekhouche, Khaled ; Bowdery, Chris ; Buttar, Craig ; Damerell, Chris ; Djendaoui, Dahmane ; Dehimi, Lakhdar ; Gao, Rui ; Greenshaw, Tim ; Koziel, Michal ; Maneuski, Dzmitry ; Nomerotski, Andrei ; Sengouga, Nouredine ; Ste
Author_Institution
Lancaster Univ., Lancaster, UK
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
836
Lastpage
841
Abstract
Charge Coupled Devices (CCDs) have been successfully used in several high energy physics experiments over the past two decades. Their high spatial resolution and thin sensitive layers make them an excellent tool for studying shortlived particles. The Linear Collider Flavour Identification (LCFI) Collaboration has been developing Column-Parallel CCDs for the vertex detector of a future Linear Collider which can be read out many times faster than standard CCDs. The most recent studies are of devices designed to reduce both the CCD´s intergate capacitance and the clock voltages necessary to drive it. A comparative study of measured Charge Transfer Inefficiency values between our previous and new results for a range of operating temperatures is presented.
Keywords
nuclear electronics; radiation effects; readout electronics; LCFI collaboration; charge coupled devices; charge transfer inefficiencies; column-parallel CCD; high energy physics experiments; high spatial resolution; high-speed column parallel readout; linear collider; linear collider flavour identification; radiation damage; short-lived particles; thin sensitive layers; vertex detector; Capacitance; Charge coupled devices; Charge measurement; Charge transfer; Charge-coupled image sensors; Collaboration; Current measurement; Detectors; Spatial resolution; Standards development; CCD; CPCCD; LCFI; charge transfer inefficiency; radiation damage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5402404
Filename
5402404
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