• DocumentCode
    3339788
  • Title

    Comparison of measurements of Charge Transfer Inefficiencies in a CCD with high-speed column parallel readout

  • Author

    Sopczak, André ; Aoulmit, Salim ; Bekhouche, Khaled ; Bowdery, Chris ; Buttar, Craig ; Damerell, Chris ; Djendaoui, Dahmane ; Dehimi, Lakhdar ; Gao, Rui ; Greenshaw, Tim ; Koziel, Michal ; Maneuski, Dzmitry ; Nomerotski, Andrei ; Sengouga, Nouredine ; Ste

  • Author_Institution
    Lancaster Univ., Lancaster, UK
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    836
  • Lastpage
    841
  • Abstract
    Charge Coupled Devices (CCDs) have been successfully used in several high energy physics experiments over the past two decades. Their high spatial resolution and thin sensitive layers make them an excellent tool for studying shortlived particles. The Linear Collider Flavour Identification (LCFI) Collaboration has been developing Column-Parallel CCDs for the vertex detector of a future Linear Collider which can be read out many times faster than standard CCDs. The most recent studies are of devices designed to reduce both the CCD´s intergate capacitance and the clock voltages necessary to drive it. A comparative study of measured Charge Transfer Inefficiency values between our previous and new results for a range of operating temperatures is presented.
  • Keywords
    nuclear electronics; radiation effects; readout electronics; LCFI collaboration; charge coupled devices; charge transfer inefficiencies; column-parallel CCD; high energy physics experiments; high spatial resolution; high-speed column parallel readout; linear collider; linear collider flavour identification; radiation damage; short-lived particles; thin sensitive layers; vertex detector; Capacitance; Charge coupled devices; Charge measurement; Charge transfer; Charge-coupled image sensors; Collaboration; Current measurement; Detectors; Spatial resolution; Standards development; CCD; CPCCD; LCFI; charge transfer inefficiency; radiation damage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402404
  • Filename
    5402404