DocumentCode :
3339876
Title :
Thermal noise from switches in a switched-capacitor gain stage
Author :
Acharya, Arup ; Hurst, Paul J. ; Lewis, Stephen H.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
fYear :
2003
fDate :
23-25 Feb. 2003
Firstpage :
121
Lastpage :
126
Abstract :
Thermal noise in switched-capacitor (SC) gain stages limits the minimum signal amplitude that can be processed. This paper presents expressions for the input-referred noise due to thermal noise of MOS switches used in gain stages, based on a single-stage opamp model. Comparisons with simple expressions and SPICE simulations are presented. The new expressions are in closer agreement with the simulation results than the simple expressions.
Keywords :
SPICE; circuit simulation; data conversion; integrated circuit noise; switched capacitor networks; thermal noise; SPICE simulations; input-referred noise; signal amplitude; single-stage opamp model; switched-capacitor gain stage; thermal noise; 1f noise; Circuit noise; Gaussian noise; MOSFETs; Noise level; Signal to noise ratio; Switches; Switching circuits; Thermal resistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed-Signal Design, 2003. Southwest Symposium on
Print_ISBN :
0-7803-7778-8
Type :
conf
DOI :
10.1109/SSMSD.2003.1190410
Filename :
1190410
Link To Document :
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