Title :
Data readout concept and test results for the BCM1F and BSC sub-detectors of CMS
Author :
Castro, E. ; Bell, Zeuthen A J
Author_Institution :
DESY, Zeuthen, Germany
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
The Compact Muon Solenoid (CMS) is one of the two large, general purpose experiments situated on the LHC at CERN. As with all high energy physics (HEP) experiments, knowledge of the beam conditions and luminosity is of vital importance. The Beam Radiation & Monitoring Group of CMS (BRM) is responsible for several Beam Conditions Monitors that will provide, with different time resolution, permanent and accurate radiation monitoring within the CMS experiment, preventing the operation in adverse beam conditions. Two of these sub-detectors are the BSC (Beam Scintillator Counters) and BCM1F (Fast Beam Condition Monitoring 1-Fast). Both subsystems cover areas of different radiation load, however they share two main features: they have to supply bunch-by-bunch resolution and to be MIP sensitive. This suggests a similar data acquisition and data processing systems. This paper briefly reports on the subsystems features, the data acquisition scheme, some tests performed in the laboratory and preliminary results with LHC beam.
Keywords :
data acquisition; particle beam diagnostics; position sensitive particle detectors; radiation monitoring; readout electronics; scintillation counters; transition radiation detectors; Beam Conditions Monitors; Beam Radiation & Monitoring Group; Beam Scintillator Counters; CMS; Compact Muon Solenoid; Fast Beam Condition Monitoring 1-Fast; MIP sensitive; beam conditions; data acquisition; data processing systems; data readout concept; high energy physics experiments; radiation monitoring; supply bunch-by-bunch resolution; time resolution; Collision mitigation; Condition monitoring; Data acquisition; Energy resolution; Large Hadron Collider; Mesons; Radiation detectors; Radiation monitoring; Solenoids; Testing;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402414