Title :
A mixed-signal built-in self-test approach for analog circuits
Author :
Stroud, Charles ; Morton, Jason ; Islam, Atia ; Alassaly, Hazem
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina Univ., Charlotte, NC, USA
Abstract :
A built-in self-test (BIST) approach is described which is designed to test the analog portion of mixed-signal integrated circuits and systems. The BIST circuitry is located in the digital portion of the mixed-signal circuitry to minimize area overhead and effects on the analog portion of the mixed-signal system. The approach was evaluated using benchmark circuits for analog testing and found to consistently provide fault coverage greater than 95%, even when acceptable component parameter variations are added to the set of benchmark circuits.
Keywords :
built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; BIST; analog circuits; area overhead; benchmark circuits; built-in self-test approach; component parameter variations; mixed-signal integrated circuits; Analog circuits; Automatic testing; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Digital circuits; Integrated circuit testing; System testing; Test pattern generators;
Conference_Titel :
Mixed-Signal Design, 2003. Southwest Symposium on
Print_ISBN :
0-7803-7778-8
DOI :
10.1109/SSMSD.2003.1190426
