Fault injection emulation for field programmable analog arrays

Author

Slaughter, Thomas ; Stroud, Charles

Author_Institution

Dept. of Electr. & Comput. Eng., North Carolina Univ., Charlotte, NC, USA

fYear

2003

fDate

23-25 Feb. 2003

Firstpage

212

Lastpage

216

Abstract

We present a practical and economical method for physical fault insertion in analog circuits using field programmable analog arrays (FPAAs) for use in the development and evaluation of manufacturing and system-level tests for analog and mixed-signal integrated circuits and systems. The method involves the manipulation of configuration bits used to program the FPAA to emulate catastrophic faults (shorts and opens) and parametric faults (component values outside of acceptable ranges) in the FPAA during operation of the analog circuitry.

Keywords

automatic testing; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; FPAA; catastrophic faults; component values; configuration bits; fault injection emulation; field programmable analog arrays; mixed-signal integrated circuits; parametric faults; physical fault insertion; system-level tests; Circuit faults; Circuit simulation; Circuit testing; Emulation; Field programmable analog arrays; Field programmable gate arrays; Manufacturing; Prototypes; System testing; Virtual prototyping;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signal Design, 2003. Southwest Symposium on

Print_ISBN

0-7803-7778-8

Type

conf

DOI

10.1109/SSMSD.2003.1190429

Filename

1190429