• DocumentCode
    3340209
  • Title

    Influence of annealing condition on the photovoltaic performance of Cu2ZnSnSe4 thin film solar cells

  • Author

    Shou-Yi Kuo ; Jui-Fu Yang ; Fang-I Lai ; Chun-Jung Lin

  • Author_Institution
    Dept. of Electron. Eng., Chang Gung Univ., Taoyuan, Taiwan
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Abstract
    The synthesis of highly crystalline Cu2ZnSnSe4 (CZTSe) absorber films through two-stage process of the selenization of a sputtered metallic CZT precursor layers on Mo substrate followed by annealing under selenium vapor was a promising approach for fabricating high efficiency solar cells. In this study, CZTSe films have been characterized in detail using X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive spectrometer (EDS), Raman spectroscopy, and solar simulator. It was found that the structural and optical properties of CZTSe films. The SEM and Raman scattering analysis showed the formation of the CZTSe compound and crystalline quality of the CZTSe can be controlled through varying by the heating rate. Increase of the heating rate can increase the grain size of CZTSe absorber films, and lead to effect the CZTSe compound. Solar cells with the Al/Ni/AZO/i-ZnO/CdS/CZTSe/Mo showed the conversion efficiency of 0.2 % to 1.78 % for 0.13 cm2 with Voc = 0.06 V to 0.21 V, Jsc = 11.65 mA/cm2 to 31.81 mA/cm2, and FF = 0.28 to 0.31.
  • Keywords
    Raman spectroscopy; annealing; copper compounds; photovoltaic power systems; selenium; solar cells; Cu2ZnSnSe4; Raman spectroscopy; X-ray diffraction; absorber films; annealing condition; energy dispersive spectrometer; photovoltaic performance; scanning electron microscopy; selenium vapor; solar simulator; thin film solar cells; Annealing; Films; Heating; Photovoltaic cells; Raman scattering; X-ray scattering; CZTSe; heat ramp; photovoltaic cells; selenization; sputter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744165
  • Filename
    6744165