• DocumentCode
    3340451
  • Title

    Beyond van der Pauw: Sheet resistance determination from arbitrarily shaped planar four-terminal devices with extended contacts

  • Author

    Cornil, M. ; Paul, O.

  • Author_Institution
    Dept. of Microsyst. Eng., Univ. of Freiburg, Freiburg
  • fYear
    2008
  • fDate
    24-27 March 2008
  • Firstpage
    23
  • Lastpage
    28
  • Abstract
    An extension of van der Pauw´s method to determine the sheet resistance Rsq from arbitrarily shaped devices with four peripheral contacts of any size is presented. Extracting Rsq requires the measurement of six electrical resistances on these devices and the simultaneous solution of a system of six algebraic equations. The results are obtained using the method of conformal mapping in combination with the method of images. The computational effort to extract Rsq is modest. Using finite-element analysis, our findings were verified within a relative accuracy of better than 0.1%. Experimental tests with differently shaped structures are fully consistent with the novel theory.
  • Keywords
    finite element analysis; micromechanical devices; algebraic equation; arbitrarily shaped device; conformal mapping; finite element analysis; peripheral contacts; planar four-terminal device; shaped structure; sheet resistance determination; Contact resistance; Microelectronics; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on
  • Conference_Location
    Edinburgh
  • Print_ISBN
    978-1-4244-1800-8
  • Electronic_ISBN
    978-1-4244-1801-5
  • Type

    conf

  • DOI
    10.1109/ICMTS.2008.4509309
  • Filename
    4509309