DocumentCode
3340451
Title
Beyond van der Pauw: Sheet resistance determination from arbitrarily shaped planar four-terminal devices with extended contacts
Author
Cornil, M. ; Paul, O.
Author_Institution
Dept. of Microsyst. Eng., Univ. of Freiburg, Freiburg
fYear
2008
fDate
24-27 March 2008
Firstpage
23
Lastpage
28
Abstract
An extension of van der Pauw´s method to determine the sheet resistance Rsq from arbitrarily shaped devices with four peripheral contacts of any size is presented. Extracting Rsq requires the measurement of six electrical resistances on these devices and the simultaneous solution of a system of six algebraic equations. The results are obtained using the method of conformal mapping in combination with the method of images. The computational effort to extract Rsq is modest. Using finite-element analysis, our findings were verified within a relative accuracy of better than 0.1%. Experimental tests with differently shaped structures are fully consistent with the novel theory.
Keywords
finite element analysis; micromechanical devices; algebraic equation; arbitrarily shaped device; conformal mapping; finite element analysis; peripheral contacts; planar four-terminal device; shaped structure; sheet resistance determination; Contact resistance; Microelectronics; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on
Conference_Location
Edinburgh
Print_ISBN
978-1-4244-1800-8
Electronic_ISBN
978-1-4244-1801-5
Type
conf
DOI
10.1109/ICMTS.2008.4509309
Filename
4509309
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