• DocumentCode
    3340664
  • Title

    In situ space charge profile measurements on electronic irradiated material by LIMM

  • Author

    Bouchareb, S. ; Griseri, V. ; Berquez, Laurent

  • Author_Institution
    LAPLACE, Univ. de Toulouse, Toulouse, France
  • fYear
    2013
  • fDate
    June 30 2013-July 4 2013
  • Firstpage
    776
  • Lastpage
    779
  • Abstract
    Material used in space aircraft are in contact with a large panel of charged particles. Dielectrics can store charges up to a certain extend above which electrostatic discharges might occur. To prevent these phenomena that can be harmful for the embarked electronic devices, the electrical behavior of those materials under irradiation must be studied. In the present case, we are only interested in the effect of electrons on dielectrics materials properties. To do so, an irradiation chamber has been equipped with various characterization tools to perform measurements in-situ. This work is focused on in situ space charge measurements by Pulse Electro Acoustic (PEA) technique and Laser Intensity Modulated Method (LIMM) during and post-irradiation. Experimental space charge distributions obtained by both techniques will be presented and discussed taking into account the measurement arrangements.
  • Keywords
    acoustoelectric effects; charge measurement; electron beam effects; measurement by laser beam; space charge; LIMM; charged particles; dielectric materials; electronic irradiated material; electrostatic discharges; in situ space charge profile measurements; irradiation chamber; laser intensity modulated method; pulse electro acoustic technique; space aircraft; Dielectric measurement; Dielectrics; Electrodes; Measurement by laser beam; Protocols; Radiation effects; Space charge; LIMM; PEA; Space charge; electronic irradiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2013 IEEE International Conference on
  • Conference_Location
    Bologna
  • ISSN
    2159-1687
  • Print_ISBN
    978-1-4799-0807-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2013.6619708
  • Filename
    6619708